Workpackage leader: Dr Sergey Lotkhov, PTB

Other participants: MIKES, NPL, Aalto, RHUL

The aims of this workpackage are devoted to the application of the single-photon microwave detectors and sources developed in WP1 and WP2. Performance of single-photon detectors and sources will be demonstrated by integrating them together, and the developed detectors will be used in characterising and minimising the effect of background microwave radiation on the operation of cryoelectronic devices. The spectral sensitivity of (at least the most promising) detectors developed in WP1 will be characterised by connecting them either on-chip or off-chip to the most suitable microwave sources developed in WP2, and thus developing a well-characterised detector toolbox for a wide scope of possible applications. The emphasis of the work will be on the characterisation of the detection efficiency and spectral response throughout the detection spectrum and on reproducibility and universality tests. Demonstration of spectral analysis of on-chip microwave sources by on-chip detectors at the single-photon level would be a major breakthrough in science and technology.

The aims of this workpackage are devoted to the application of the single-photon microwave detectors and sources developed in WP1 and WP2. Performance of single-photon detectors and sources will be demonstrated by integrating them together, and the developed detectors will be used in characterising and minimising the effect of background microwave radiation on the operation of cryoelectronic devices. The spectral sensitivity of (at least the most promising) detectors developed in WP1 will be characterised by connecting them either on-chip or off-chip to the most suitable microwave sources developed in WP2, and thus developing a well-characterised detector toolbox for a wide scope of possible applications. The emphasis of the work will be on the characterisation of the detection efficiency and spectral response throughout the detection spectrum and on reproducibility and universality tests. Demonstration of spectral analysis of on-chip microwave sources by on-chip detectors at the single-photon level would be a major breakthrough in science and technology.