Publications & Standards

Table of samples available and measurement results achieved (including uncertainties):

Available reference material

Contact

Molecular multi-layer with delta layers for measuring sputtering yield and interface resolution in XPS and SIMS depth profiling

steve.spencer@npl.co.uk

Mixed molecular layers for assessing quantification in XPS and SIMS depth profiling

steve.spencer@npl.co.uk

Nanostructured block-copolymer films with characteristic dimensions between 20 nm and 75 nm for evaluation of scanning probe microscopy methods

l.boarino@inrim.it

Method

Characteristic measurand

Contact

Grazing Incidence X-ray Fluorescence

2.5% (relative uncertainty for quantification)

burkhard.beckhoff@ptb.de

SIMS depth profiling of organics

5 nm (interface resolution

rasmus.havelund@npl.co.uk

Electrical atomic force microscopy

30 nm (lateral resolution)

fernando.castro@npl.co.uk

Publications

  • P. Hönicke, B. Detlefs, M. Müller , E. Darlatt, E. Nolot, H. Grampeix, B. Beckhoff, Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis, Physica Status Solidi (A), 2015, 212(3), 523-528
    http://dx.doi.org/10.1002/pssa.201400204
  • M. Kolbe, P. Hönicke, Fundamental parameters of Zr and Ti for a reliable quantitative X-ray fluorescence analysis, X-ray spectrometry, 2015
    http://dx.doi.org/10.1002/xrs.2603
  • C. Fleischmann, T. Conard, R. Havelund, A. Franquet, C. Poleunis, E. Voroshazi, A. Delcorte and W. Vandervorst, Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors, Surface and Interface Analysis, 2014, 46 (51) pp 54-57
    http://onlinelibrary.wiley.com/doi/10.1002/sia.5621/abstract
  • A. Franquet, C. Fleischmann, T. Conard, E. Voroshazi, C. Poleunis, R. Havelund, A. Delcorte and W. Vandervorst, G-SIMS analysis of organic solar cell materials, Surface and Interface Analysis, 2014, 46 (S1) pp 96-99
    http://onlinelibrary.wiley.com/doi/10.1002/sia.5650/abstract
  • R. Havelund, M.P. Seah, A.G. Shard, and I.S. Gilmore, Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organics, 2014, Journal of the American Society of Mass Spectrometry, 25 (9) pp 1565-1571
    http://www.ncbi.nlm.nih.gov/pubmed/24912434
  • A.G. Shard, S.J. Spencer, S.A. Smith, R. Havelund, and I.S. Gilmore, The matrix effect in organic secondary ion mass spectrometry, 2014, doi:10.1016/j.ijms.2014.06.027
    http://www.sciencedirect.com/science/article/pii/S138738061400253X
  • M.P. Seah, R. Havelund and I.S. Gilmore, Universal Equation for Argon Cluster Size-Dependence of Secondary Ion Spectra in SIMS of Organic Materials, 2014, Journal of Physical Chemistry C, 118 (24) pp 12862-12872
    http://dx.doi.org/10.1021/jp502646s
  • P. Hermann, A. Hoehl, G. Ulrich, C. Fleischmann, A. Hermelink, B. Kästner, P. Patoka, A. Hornemann, B. Beckhoff, E. Rühl, and G. Ulm , Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy, Optics Express, 2014, 22 (15)
    http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-22-15-17948
  • Müller, M., Hönicke, P., Detlefs, B., and Fleischmann, C., Characterization of High-k Nanolayers by Grazing Incidence X-ray Spectrometry, Materials, 2014, 7 (4), pp 3147-3159
    http://www.mdpi.com/1996-1944/7/4/3147
  • L. Yang, M.P. Seah, I.S. Gilmore, R.J.H. Morris, M.G. Dowsett, L. Boarino, K. Sparnacci and M. Laus, Depth Profiling and Melting of Nanoparticles in Secondary Ion Mass Spectrometry (SIMS), Journal of Physical Chemistry C, 2013, 117 (31) pp 16042-1605
    http://pubs.acs.org/doi/abs/10.1021/jp4048538
  • Gilmore, I. S., SIMS of organics-Advances in 2D and 3D imaging and future outlook, J. Vac. Sci. Technol. A, 2013, 31, 050819
    http://scitation.aip.org/content/avs/journal/jvsta/31/5/10.1116/1.4816935
  • Seah, M. P., Universal Equation for Argon Gas Cluster Sputtering Yields, J. Phys. Chem. C, 2013, 117 (24), pp 12622-12632
    http://pubs.acs.org/doi/abs/10.1021/jp402684c
  • Yang, L., Seah, M. P., Gilmore, I. S., Morris R. J. H., Dowsett, M. G., Boarino, L., Sparnacci, K., and Laus, M., Depth Profiling and Melting of Nanoparticles in Secondary Ion Mass Spectrometry, J. Phys. Chem. C, 2013, 117 (31), pp 16042-16052
    http://pubs.acs.org/doi/abs/10.1021/jp4048538
  • Yang, L., Seah, M. P., and Gilmore, I. S., Sputtering Yields for Gold Using Argon Gas Cluster Ion Beams, J. Phys. Chem. C, 2012, 116 (44), pp 23735-23741
    http://pubs.acs.org/doi/abs/10.1021/jp307203f

 

For more information: Fiona Moriarty