Metrology for the manufacturing of thin films
Electronic thin films are at the heart of a multi-billion Euro worldwide sector that includes plastic and printed electronics, displays and lighting, memories and solar cells.
This project will establish a pan-European metrology capability with the goal of providing validated and/or traceable metrology for thin film materials properties; composition and structure; and for controlling large area homogeneity and consistency of properties. This should allow high-quality, cost-effective manufacturing, facilitate product development reducing time-to-market and, therefore increase competitiveness of European industry.
The updated publishable summary can be found here.