Publications
- Chemical speciation at buried interfaces in high-temperature processed polycrystalline silicon thin-film solar cells on ZnO:Al. Ch. Becker, M. Pagels, C. Zachäus, B. Pollakowski, B. Beckhoff et al. J. Appl. Phys (2013)
- Optical characterisation of patterned thin films. D. Rosu, P. Petrik, G. Rattmann, M. Schellenberger, U. Beck, A. Hertwig. Thin Solid Films (2013)
- High temperature thermal conductivity of amorphous Al2O3thin films grown by low temperature ALD. A. Cappella, J.-L. Battaglia, V. Schick, A. Kusiak, A. Lamperti, C. Wiemer and B. Hay. Adv. Eng.Mat (2013)
- Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se2 absorber films. C. Streeck, S. Brunken, M. Gerlach, C. Herzog, P. Hönicke, C. A. Kaufmann, J. Lubeck, B. Pollakowski, R. Unterumsberger, A. Weber, B. Beckhoff, B. Kanngießer, H.-W. Schock, and R. Mainz. Appl. Phys. Lett
- High temperature thermal conductivity of amorphous Al2O3thin films grown by low temperature ALD. A. Cappella, J.-L. Battaglia, V. Schick, A. Kusiak, A. Lamperti, C. Wiemer and B. Hay. Advanced Engineering Materials (6 Aug. 2013)
- Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry. P. Petrik et al., Thin Solid Films (2013)
- Accurate measurements of water vapor transmission through high-performance barrier layers. P. J. Brewer, B. A. Goody, Y. Kumar, and M. J. T. Milton. Rev. Sci. Instrum. 83, 075118 (2012);
- Characterization of ZnO structures by optical and X-ray methods, P. Petrik, B. Pollakowski, S. Zakel, T. Gumprecht, B. Beckhoff, M. Lemberger, Z. Labadi, Z. Baji, M. Jank, A. Nutsch, Applied Surface Science (2012)
- Chemical speciation at buried interfaces in high-temperature processed polycrystalline silicon thin-film solar cells on ZnO:Al. Christiane Becker, Marcel Pagels, Carolin Zachäus, Beatrix Pollakowski, Burkhard Beckhoff, Birgit Kanngießer, and Bernd Rech, J. Appl. Phys. 113, 044519 (2013)
- Optical thin film metrology for optoelectronics, Peter Petrik, Journal of Physics: Conference Series 398 (2012)
EMRP ThinFilms Newsletter Feb 2012
