News & Events
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Successful delivery of E-MRS Spring Meeting 2014 Symposium by
EMRP projects
ALTECH 2014 delivered 160 presentations in 4.5
days
During w/c 26 May 2014, the European Materials Research Society (E-MRS) Spring Meeting attracted over 3,000 scientists and engineers to Lille, France, for 4.5 days of conference and industrial trade show
Members of EMRP Thin Films, with support from EMRP TreND, organised Symposium H, ALTECH2014 - Analytical techniques for the characterisation of nanomaterials, which attracted 160 contributions from all over the world, including invited and contributed talks, tutorials and posters.
As part of ALTECH a workshop and a tutorial session dedicated to Highlights of the EMRP projects was also organised. These included contributions from EMRP Thin Films, TReND, Q-AIMDS and Nanostrain.
Another highlight of the meeting was the very successful joint sessions with other symposia on: metrology for thin film photovoltaics (with symposium A); and nanoscale morphology vs function for organic electronics (with symposium DD). Both attracted hundreds of people (see photos above) and increased exposure of our work.
Finally, we were also pleased to have over 40 people participating in the last talk of the last day (during lunchtime on the Friday!).
Feedback has been very positive and several new contacts have been made.
Further information about the symposium
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8 October 2013, International Congress of Metrology |
8 October 2013
International Congress of
Metrology:
'Reliable characterization methodologies for advanced materials':
In September 2013 the JRP will host another targeted event (Workshop on Optical characterisation) that will bring together equipment manufactures, end-users and researchers covering ellipsometry, Raman, and XRF metrology. We have also started organising a large Symposium cover all aspects of the JRP as part of the European Materials Research Society Spring Meeting which typically attracts between 2,000 and 3,000 attendees every year and include a large industry exhibition.
As of 1 November 2012 we are pleased to have University of Delft working on this project and as of 1 August 2013 we will be pleased to include Technische Universität Berlin
26 February 2013
A successful 18-month meeting
was held at PTB, Berlin. The project is progressing well, with many outcomes
being distributed via conference presentations and publications.
This was a very successful stakeholder workshop on fundamental atomic parameters. The one-day event attracted over 50 attendees from industry, university research centres and acted as a forum, not only for dissemination of JRP work, but also for feedback and new ideas for future industry requirements.
EMRP project selected to organise international symposium in E-MRS
The European Materials Research Society (E-MRS) Spring Meeting attracts over 2,000 scientists and engineers every year with a combination of technical and plenary sections and a large industrial exhibition. In 2011, there were more than 3,000 participants from 62 countries. Members of EMRP Thin Films, with support from EMRP TreND, applied for and were accepted to organise a full symposium in the EMRS Spring Meeting 2014.
The ALTECH2014 - Analytical techniques for the characterisation of nanomaterials symposium is expected to attract over 100 contributions. A stakeholder EMRP Thin Film workshop and a training workshop from EMRP TReND will also be organised attached to the Symposium.
Further information about the symposium
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1st meeting at VSL, Delft |
2 February 2012
1st periodic meeting held at
VSL, Delft, The Netherlands
10 August 2011
EMRP ThinFilms project kick-off
meeting held at NPL, Teddington, UK
1 August 2011
Project launch
