Work Packages
WP1: Validation and traceability of fundamental properties
(NPL, Aalto, BAM,CEA, CMI, LNE, PTB, INMETRO, SolarPrint, TED, Imperial College) 77 PM
Traceability and validation lie at the core of ensuring measurement confidence. A lack of confidence in the measurement of several key parameters is posing a major obstacle to the development of next generation (thin film) optoelectronic technologies. A critical assessment of important and urgent needs has led to the prioritisation of five key properties: water vapour transmission rate (WVTR), charge mobility, thickness measurement (in the 2-10 ?m range), thermal conductivity and underpinning parameters for X-ray analysis.
WP2: Cutting-edge microstructure characterisation
(PTB, CEA, NPL, PANalytical, IISB, HZB, Imperial College) 95 PM
The aim of this work package is to qualify different X-ray and Raman spectroscopy methods to characterise the microstructure of complex thin films. The tasks cover surface and buried surface characterisation, depth profile traceable measurements and the development of calibrated reference samples with known impurity concentration or elemental depth profiling. In view of the traceability foundations to be achieved, independent characterisation methodologies will be applied and validated by careful assessments of respective procedures. Here, traceable off-line methodology will support the qualification and calibration of on-line and in-line instruments
WP3: Industrially relevant large area characterisation
(VSL, Aalto, BAM, CMI, NPL, SolarPrint, TED, IISB) 63 PM
This WP will take crucial steps towards fast inline metrology over large areas, by developing techniques and prototype devices ready for uptake into industry. Task 1 will provide techniques for establishing the crucial link between device performance on the macroscopic scale and microscopic properties of the thin film or multilayer structures. Task 2 will deal with optical measurement techniques over large areas. The main focus here will be to work on devices that allow the efficient measurements of large areas, which can ultimately lead to measurement solutions for inline application. In task 3, the important problem of measuring inhomogeneous films and films on complicated substrates is addressed. Not only the measurements themselves, but also the data evaluation require special attention, once the samples are no longer flat and uniform. Therefore data analysis methods and software will be developed.
WP4: Creating impact
(BAM, all) 18 PM
All activities in this work package are designed to exploit and leverage the skills and knowledge generated within the JRP to accelerate innovation and competitiveness of the EU thin film sector.
