EMMA Club - Technical Coverage of Topics

The wide remit of the EMMA Club allows it to continue to provide a discussion forum covering any or all of the following:

  • Measurements on polymers, ceramics, ferrites, glasses, liquids, composites, nanocomposites, carbon nanotubes, graphene, multifunctional, multiferroic and biological materials (including biological cells), on organic conductors, fabrics and on natural materials.

  • EM materials measurement uncertainties, good practices and the choice and optimisation of measurement methods.

  • Small-scale probing of dielectric and magnetic properties, sub-mm down to nanoscale - including microwave microscopes, AFM-based EM measurements

  • On-wafer characterisation of functional thin films, including magnetic films

  • Measurements to support electronics industries: e.g. substrates, PCBs and dielectric resonator materials.

  • Measurements for health and safety, e.g. to support Specific Absorptions Rate (SAR) and RF exposure metrology.

  • Measurements on metamaterials and the determination of suitable parameters for characterising them.

  • Measurements on Radiation Absorbing Materials (RAM) and other high loss materials

  • Measurements for Defence purposes

  • Measurements to support RF and microwave processing

  • Applications of high frequency dielectric spectroscopy

  • Measurements of intrinsic parameters: conductivity, complex permittivity and permeability, chirality, magnetoelectric coefficients, anisotropy - and extrinsic parameters such as screening, transmission and reflection coefficients.

  • RF, microwave, millimetre-wave and terahertz (THz) methods including THz pulse imaging (TPI).

  • Characterisation of materials in measurement cells, with probes and in free-space, including quasi-optic systems.

 

Contact Bob Clarke and Kevin Lees at eminda@npl.co.uk or use our Contact page