Technical Work Packages

WP1 - AFM based NSMM

Traceability for AFM-based Near-Field Scanning Microwave Microscopes (NSMMs)

Nano-scale - Modelling - Traceability - Inhomogeneous Samples - Active thin-films

WP2 - Resonator based NSMM

Traceability for Novel NSMMs

Micro-scale - Modelling - Traceability - Broad-band - Anisotropy - Active thin-films

WP3 - Laminar Materials

Traceable Broadband Dielectric Measurements of Substrate and Laminar materials

CPW - On-wafer - Broad-band (80 GHz) - Traceability - Sheet Resistance: Metals, Semiconductors, Graphene

WP4 - Advanced Materials

Enhanced Traceability for Advanced & Functional Materials

CPW-material-modelling - Thin-films - Traceability - Functional materials - Multiferroics

WP5 - Macroscale measurements

The Challenge of Novel Measurements on Bulk Materials across the Spectrum

Bulk materials - RF Challenge - Broadband - Traceability

 

Contact Bob Clarke and Kevin Lees at eminda@npl.co.uk or use our Contact page