GUM (Poland)
Contact for measurement enquiries: Lukasz Usydus: l.usydus@gum.gov.pl,
Tel. +48-22-581-9503
| NPL | GUM | LNE | METAS | SIQ |
General RF & Microwave capabilities:
Measurements of S-parameters up to 40 GHz in coaxial standards: PC7, N50, N75, 3.5 mm and 2.4 mm
Measurements of RF power and power sensor calibrations in coaxial standards: PC7, N50, N75 and 3.5 mm, up to 33 GHz
Measurements of RF attenuation up to 20 GHz in coaxial standards: PC7, N50, N75 and 3.5 mm.
Dielectric measurements capabilities:
Resonators for low loss microwave measurements on laminar specimens: Split-post resonators: 2.5 GHz for laminar specimens and thin films including high resistivity semiconductors and resistive films (>3 KΩ/sq)
TE0mn mode resonator for low loss microwave measurements of bulk low loss dielectric specimens at few frequencies
TE011, TE021 mode resonator for measurements of conductivity of thick metals films (thickness larger than skin depth)
GUM is collaborating with Warsaw Technical University (WUT) where the Contact is Prof. Jerzy Krupka j.krupka@imio.pw.edu.pl The following capabilities are available at WUT:
Dielectric measurements capabilities:
Resonators for low loss microwave measurements on laminar specimens: Split-post resonators: 1.1 GHz, 1.9 GHz, 2.5 GHz, 5 GHz, 10 GHz, 15 GHz, 20 GHz for laminar specimens and thin films including high resistivity semiconductors and resistive films (>3 KΩ/sq)
TE0mn mode resonators for low loss microwave measurements of bulk low loss dielectric specimens at few frequencies
Whispering gallery mode dielectric resonator technique for low loss microwave measurements of bulk low loss dielectric specimens at few frequencies
Single post dielectric resonators for measurements of conductivity of thin metal films and resistivity of semiconductor wafers
Close cycle helium cryostat for low temperature measurements of dielectrics and thin conducting films. 15 K - 300 K Films on 10 mm x 10 mm substrates
