• N M Ridler, R G Clarke, M J Salter and A Wilson, The Trace is on Measurements: Developing Traceability for S-Parameter Measurements at Millimeter and Submillimeter Wavelengths, IEEE Microwave Magazine, Vol 14, No 7, pp 67-74, Nov/Dec 2013 (Invited feature article)
• N M Ridler and M J Salter, Evaluating and Expressing Uncertainty in High-frequency Electromagnetic Measurements - a selective review, Metrologia, Vol 51, pp S191-S198, 2014
• N Nazoa and N M Ridler, Cost-effective Models Simulate SMT Components DC to 18 GHz, Microwaves & RF, July 2014
• J Hoffmann, J Ruefenacht, M Zeier, The Propagation Constant of Coaxial Offset Shorts with Rough Surfaces, Conference on Precision Electromagnetic Measurements, August 2014
• M Zeier, J Hoffmann, P Huerlimann, R Judaschke, K Kuhlmann, J Ruefenacht, M Wollensack, Stability tests of electronic calibration units, Conference on Precision Electromagnetic Measurements, August 2014
• K Kuhlmann, R Judaschke, Reduction Technique for Measurement Comparisons with Complex-Valued Measurands, Conference on Precision Electromagnetic Measurements, August 2014
• M J Salter, N M Ridler, Use of Reduced Aperture Waveguide as a Calculable standard for the Verification of Millimetre-wave Vector Network Analyser, European Microwave Conference
• H Huang, N M Ridler, M J Salter, Connection Repeatability of Cross-connected Waveguide Verification Standards for Millimetre-wave Vector Network Analysis, Asia-Pacific Microwave Conference, Proc. APMC 2014, pp 907-909, November 2014
• S Papantonis, N M Ridler, A Wilson, S Lucyszyn, Reconfigurable waveguide for vector network analyzer verification, IEEE Trans MTT
• Martin Hudlicka, Measurement of balanced devices using vector network analyzer, 40th meeting of the Czech elektrotechnical society, Sub-group Microwave Technique, May 2014, pp 1-4, ISBN 978-80-02-02527-6
• J Hoffmann, M Wollensack, J Ruefenacht, M Zeier, Extended S-parameters for Imperfect Test Ports, Metrologia, Vol 52 (2015) 121-129
• S. Zinal, Modeling of Multiple Coated Coaxial Air-lines Considering Finite Conductivity and Surface Roughness, European Microwave Week 2015, Approved, awaiting publication
• N. Ridler and R Clarke, Metrology for Vector Network Analyzers, Terahertz Metrology, ISBN-13: 978-1-60807-776-2, Artech House, Chapter 9, editor M Naftaly, pp 185-249, 2015
• N. Shoaib, N. Ridler and M. Salter, Commissioning of the NPL WR-05 Waveguide Network Analyser System for S-Parameter Measurements from 140 GHz to 220 GHz, NPL Report TQE 12, NPL, Teddington, Middlesex, UK
• N. Shoaib, K. Kuhlmann, R. Judaschke, Investigation of verification artefacts in rectangular waveguides up to 325 GHz, Proc. 1st URSI Atlantic Radio Science Conference,
• N. Shoaib, K. Kuhlmann, R. Judaschke, A novel type n coaxial air-line verification standard, Proc 1st URSI Atlantic Radio Science Conference
• N. Shoaib, K. Kuhlmann, R. Judaschke, A novel type n coaxial air-line verification standard, Metrologia, Vol 52 (Apr. 2015) 469–477
• N. Shoaib, K. Kuhlmann, R. Judaschke, M. Sellone, L. Brunetti, Investigation of Verification Artifacts in WR-03 Waveguides, Journal of Infrared, Millimeter, and Terahertz Waves, Vol 36 (Nov. 2015) 1089-1100
• J. Hoffmann, M. Wollensack, J. Ruefenacht, M. Zeier, Comparison of Methods for Measurement of Equivalent Source Match, Proc. of the European Microwave Conference, Proceedings of the 45th European Microwave Conference, pp 730–733, 2015
• M. D'Auria, W. J. Otter, J. Hazell, B. T. W. Gillatt, C. Long-Collins, N. M. Ridler, S. Lucyszyn, et al, 3D Printed metal-pipe rectangular waveguides, IEEE Trans. Components, packaging and manufacturing technology, vol.5 (9) pp1339-1349, (Sept 2015)
• D. Schreurs, S. Liu, G. Avolio, I Ocket, Impact of measurement uncertainty on modelling, 21st International conference on microwave radar and wireless communications, (MIKON), Krakow, Poland, pp 1-4, 2016
• K. Hoffmann, Radiation of the coaxial-microstrip transition in precise microwave measurements, 43rd meeting of the Czech elektrotechnical society, subgroup Microwave technique, Prague, 19 May 2016, pp 1-4, ISBN 978-80-02-02654-9,
• D. Allal, B. Hall, P. Vincent, A. Litwin, F. Ziadé, Propagation automatique des incertitudes : application aux techniques d'auto-étalonnage des analyseurs de réseau vectoriels, 17th International Congress of Metrology, 2015
• S. Zinal, D. Allal and M. Salter, Comparison of Calibration Methods for Multiport VNAs up to 67 GHz, CPEM 2016 (Conference on Precision Electromagnetic Measurements)
• D. Allal, A. Litwin, P. Vincent, F. Ziade, Vector Network Analyzer Comparison up to 110 GHz in 1 mm Coaxial Line, CPEM 2016 (Conference on Precision Electromagnetic Measurements)
• F. Ziade, M. Hudlicka, M. Salter, T. Pavlicek, D. Allal, Uncertainty Evaluation of Balanced S Parameter Measurements, CPEM 2016 (Conference on Precision Electromagnetic Measurements)

82nd ARFTG Microwave Measurement conference, 20-21 November 2013, Columbus, OH, USA:

• N M Ridler, R G Clarke, Investigating connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz, Proc. 82nd ARFTG Microw. Meas. Conf, Vol 82, pp 87-99, Nov 2013 (Best conference paper)
• Faisal Mubarak, Gert Rietveld, Dennis Hoogenboom, Marco Spirito, Characterizing Cable Flexure Effects in S-parameter Measurements, Proc. 82nd ARFTG Microw. Meas. Conf, Vol 82, pp 103-105, Nov 2013
• S Papantonis, N M Ridler and S Lucyszyn, A New Technique for Vector Network Analyzer Calibration Verification Using a Single Reconfigurable Device ( Watch on YouTube)
• K Wong, J Hoffmann, Report on Connector effects, IEEE standards committee P287 (coaxial connectors)

83rd ARFTG Microwave Measurement Conference, June 2014, Tampa, FL, USA:

• M Haase, K Hoffmann, Calibration for Extreme Load Impedance Measurement, Proc. 83rd ARFTG Microw. Meas. Conf, Vol 83, pp 38-43, Jun 2014
• Faisal Mubarak, Gert Rietveld, Marco Spirito, A Method for De-Embedding Cable Flexure Effects in S-parameter Measurements, Proc. 83rd ARFTG Microw. Meas. Conf, Vol 83, pp 123-127, Jun 2014
• H Huang, N M Ridler, M J Salter, Using Electromagnetic Modeling to Evaluate Uncertainty in a Millimeter-wave Cross-guide Verification standard, Proc. 83rd ARFTG Microw. Meas. Conf, Vol 83, pp 93-97, Jun 2014
• N M Ridler, R G Clarke, Further Investigations into Connection Repeatability of Waveguide Devices at Frequencies from 750 GHz to 1.1 THz, Proc. 83rd ARFTG Microw. Meas. Conf, Vol 83, pp 83-89, Jun 2014

84th ARFTG Microwave Measurement Conference, December 2014:

• N Ridler, R Clarke, Evaluating the effect of using precision alignment dowels on connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz, ARFTG Microwave Measurement Conference, Vol 84, pp 24-32, December 2014
• J Stenarson, C Eio, K. Yhland, A calibration procedure for electronic calibration units, 84th ARFTG Microwave Measurement Conference, Vol 84, Dec 2014
• S Zinal, Steady-state Skin Effect in Multilayer-Conductor Coaxial Lines, European Microwave Week, 2014
• Faisal Mubarak and Gert Rietveld, Residual Error Analysis of a Calibrated Vector Network Analyzer, ARFTG Microwave Measurement Conference, Vol 84, Dec 2014

85th ARFTG Microwave Measurement Conference, May 2015:

• M. Rajabi, D. A. Humphreys, T. Nielsen, P. Barmuta, D. Schreurs, Design and Analysis of a Verification Device for the Nonlinear Vector Network Analyzer, Proc. of 85th ARFTG Microwave Measurement Conference, Vol. 85, May 2015, ISBN: 978-1-4799-8886-0
• N. Ridler and M. Salter, Analyzing Uncertainty Matrices Associated with Multiple S‑parameter Measurements, Proc. of 85th ARFTG Microwave Measurement Conference, Vol. 85, May 2015, ISBN: 978-1-4799-8886
• M. Haase, K. Hoffmann, Z Skvor, Microstrip Open - Problematic Calibration Standard, Proc. of 85th ARFTG Microwave Measurement Conference., Vol. 85, May 2015, ISBN: 978-1-4799-8886-0

86th ARFTG Microwave Measurement Conference, December 2015:

• K. Drazil, A. Pavlis, M. Hudlicka, Performance assessment of VNA calibration schemes for millimeter-wave and submillimeter-wave frequencies, using the 33 GHz-50 GHz band, Proc. of 86th ARFTG Microwave Measurement Conference, Vol. 86, December 2015, ISBN: 978-1-4673-9246-4
• M. Haase, K. Hoffmann, Calibration/Verification Standards for Measurement of Extremely High Impedance, Proc. of 86th ARFTG Microwave Measurement Conference, Vol. 86, December 2015, ISBN: 978-1-4673-9246-4

87th ARFTG Microwave Measurement Conference, 27-28 May 2016, San Francisco, CA, USA:

• G. Bosi, A. Raffo, G. Avolio, D. Schreurs, D. A. Humphreys, Impact of microwave measurement uncertainty on the non-linear embedding procedure, Proc. 87th ARFTG Microw. Meas. Conf. vol 82, pp 1-4, 2016
• D. A. Humphreys, A. Raffo, G. Bosi, G. Vannini, D. Schreurs, K. N. Gebremicael, K. Morris, Maximising the benefit of existing equipment for non-linear communication measurements, Proc. 87th ARFTG Microw. Meas. Conf. vol 82, pp 1-4, 2016
• M. Haase, K. Hoffmann, M. Hudlicka, Traceable high impedance calibration standards, Proc. 87th ARFTG Microw. Meas. Conf. vol 82, pp 1-4, 2016
• K. Kuhlmann, A study of the reference impedance influence on a TRL calibration, Proc. 87th ARFTG Microw. Meas. Conf. vol 82, pp 1-4, 2016
• J. Hoffmann, M. Wollensack, J. Ruefenacht, D. Stalder, M. Zeier, Traceable calibration with 1.0mm coaxial standards, Proc. 87th ARFTG Microw. Meas. Conf. vol 82, pp 1-4, 2016
• U. Arz, Investigating correlations in frequency-domain S-parameter measurements, Proc. 87th ARFTG Microw. Meas. Conf. vol 82, pp 1-4, 2016

• H Huang, N M Ridler and M J Salter, Investigating Waveguide Flange Quality in the 140 GHz to 220 GHz Band, 1st Agilent Millimetre-wave and Terahertz Users Meeting, 14 October 2013, Winnersh, UK
• N M Ridler, Electromagnetic Measurement, Conference: Guide to the Expression of Uncertainty in Measurement - Past, Present and Future, 7-8 November 2013, NPL, UK
• N M Ridler, Measurement Uncertainty, NIST/ARFTG Microwave Measurement training course, 18-19 November 2013, Columbus, OH, USA
• R G Clarke, H Huang, N M Ridler and M J Salter, Investigating Rectangular Metallic Waveguide Interconnects at Millimetre wave and Terahertz frequencies, IET Colloquium on Millimetre-wave and Terahertz Engineering & Technology, March 2014, University of Liverpool
• M. Hudlicka, Measurement of balanced devices using vector network analyzer, 40th meeting of the Czech electrotechnical society, subgroup Microwave technique, 21 May 2014, Prague, Czech Republic
• C. Eio, D. Allal, P. Huerlimann, J. Ruefenacht, S. Zinal, Measurement Comparison up to 65 GHz in Coaxial 1.85 mm Line, CPEM 2016 (Conference on Precision Electromagnetic Measurements)
• D. Humphreys, D Schreurs, A Nonlinear Verification Device for Nonlinear Vector Network Analyzers, CPEM 2016 (Conference on Precision Electromagnetic Measurements)
• F. Mubarak and J. Hoffmann, Effects of Connectors and Improper Mounting of Air Lines in TRL Calibration, CPEM 2016 (Conference on Precision Electromagnetic Measurements)
• F. Mubarak ; M. Zeier ; J. Hoffmann ; N M Ridler ; M J Salter ; K. Kuhlmann, Verification concepts in S-parameter measurements, CPEM 2016 (Conference on Precision Electromagnetic Measurements)
• F. Mubarak, E. Dierikx, G. Rietveld, Traceable DC – 18 GHz Characterization of Coaxial 50 Ω Impedance Standards, CPEM 2016 (Conference on Precision Electromagnetic Measurements)

1st European ANAMET meeting, December 2013, SP, Sweden:

• N M Ridler, European Research Project - Metrology for new electrical measurement quantities in high-frequency circuits: an overview of activities
• J Stenarson, C Eio, Uncertainty in two-port electronic calibration units: A progress report on the uncertainty model
• M Zeier, ECU drift methodology and preliminary results including discussions
• K Kuhlmann, R Judaschke, Electronic Calibration Units - temperature stability tests
• Peter Huerlimann, ECU Stability Short 1st data set
• N M Ridler, R G Clarke, Investigating connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz
• Faisal Mubarak, An automated system for investigation of the impact of cable flexure on VNA measurements
• K Wong, ECAL - design and test overview

2nd European ANAMET meeting, June 2014, VSL, Delft, Netherlands:

Click on presentation titles to access audio and visual slides (where available).

• Nick Ridler, European Research Project HF-Circuits - Metrology for New Electrical Measurement Quantities in High-frequency Circuits: Overview and Update of Activities
• Juerg Ruefenacht, Best Measurement Practice in VNA Measurements - Hints for the Practioner (.mpg / 1.491 Gb)
• Faisal Mubarak, A Method for De-Embedding Cable Flexure Effects in S-parameter Measurements (.mpg / 93 Mb)
• J Stenarson, An Update on Work Establishing Residual Error Models for Electronic Calibration Units
• M J Salter, Assessing Connectorised Printed Circuit Boards (PCBs) for Differential and Single-ended Propagation (.mpg / 614 Mb)
• Jochen Simon, Implementation of Mixed-Mode S-Parameter and Wave Quantity Measurements in R&S Vector Network Analysers
• M Haase, K Hoffmann, Calibration for Extreme Load Impedance Measurement
• S Zinal, Modeling of Multiple Coated Coaxial Air-lines Considering Finite Conductivity and Surface Roughness
• Mohammed Rajabi, Provisional Designs of a Reference Device for Nonlinear and Large-signal Network Analysis

3rd European ANAMET Meeting, December 2014, PTB, Braunschweig, Germany:

• N M Ridler, European Research Project 'HF-Circuits' - 'Metrology for New Electrical Measurement Quantities in High-Frequency Circuits': Overview and Update of Activities
• K. Kuhlmann, Reduction technique for measurement comparisons with complex-valued measurands
• M. Rajabi, Design for candidate reference devices for the LSNA and NVNA
• M. Salter ,Use of reduced aperture waveguide to verify mm-wave S-parameter measurements
• Martin Hudlicka, Tomas Pavlicek, Calibration of a VNA operating in the differential mode
• D. Allal, F. Ziadé, Simulations of Balanced Microstrip and Stripline Standards
• F.J. Schmückle, Parasitic electromagnetic effects in differential probes, pads, connectors and transitions - challenges and solutions
• M. Zeier, The New EURAMET cg-12 Guide - Guidelines on the Evaluation of Vector Network Analysers
• M. Zeier, J. Hoffmann, J. Ruefenacht, M. Wollensack, A simplified method of VNA uncertainty evaluation
• F. Mubarak, A Method for Residual Error Analysis of a Calibrated VNA
• J. Hoffmann, Connector effect and ripple method
• Jörgen Stenarson, Deriving the residual error model from uncertainties in reflection standards
• N M Ridler, Using the 'ripple' technique to evaluate residual errors in waveguide VNAs

4th European ANAMET Meeting, June 2015, METAS, Bern, Switzerland:

• Nick Ridler, European Research Project 'HF-Circuits' - 'Metrology for New Electrical Measurement Quantities in High-Frequency Circuits': Overview and Update of Activities
• Sherko Zinal, Investigation of Calibration Methods for VNA Multiport Measurements
• Martin Salter, 4 port VNA versus 2 port VNA: A comparison of methods for measuring the S parameters of a directional coupler
• Johannes Hoffmann, Juerg Ruefenacht, Michael Wollensack ,Comparison of methods for measurement of Equivalent Source Match comparison of existing 2-port and 3-port methods, analysis of uncertainties, practical aspects, software support (also presentations 04b and 04c)
• Faisal Mubarak, A revised airline ripple method
• Nick Ridler, Using uncertainty matrices to analyse measurements of multiple S-parameters
• Djamel Allal, Propagation of calibration standards uncertainties through TRL procedure
• Franz-Josef Schmückle, Sinha Siddhartha, Tolerances and losses in rectangular waveguides using time domain and frequency domain solvers - problems and results (also presentation 08b)
• Franz-Josef Schmückle, Sinha Siddhartha, Electromagnetic simulations of rectangular waveguide probes for sub-Terahertz measurements - comparison of different basic configurations

6th European ANAMET Meeting, June 2016, NPL, Teddington, UK:

• Nick Ridler, European research project - Metrology for new electrical measurement quantities in high-frequency circuits
• Karsten Kuhlmann, Characterisation of calibration standards for 1 mm connectors
• Juerg Ruefenacht, Adapter characterization up to 110 GHz
• Martin Hudlicka, Performance assessment of VNA calibration schemes for millimeter-wave and submillimeter-wave frequencies using the 33 GHz - 50 GHz band
• Djamel Allal, Simulation of calibration standards and VNA calibration in differential mode
• Martin Salter, A reference Printed Circuit Board (PCB) for the calibration and verification of S-parameter measurements
• Markus Zeier, The revision of EURAMET guide cg-12 (PDF file) – see also training presentation (MP4 file)
• Karsten Kuhlmann, Good Practice Guide for the recalibration of ECUs and D2.3.1, D2.3.9 and D2.3.10
• Faisal Mubarak, Uncertainty evaluation of a calibrated VNA
• Karel Hoffman, Traceable high impedance calibration standards
• David Humphreys, One-port and two-port nonlinear verification device for NVNA